February 22, 2018 Schaumburg, IL – Bowman, a US manufacturer and global service provider for XRF coating measurement instruments, has introduced its P Series, a versatile benchtop XRF instrument.

Bowman’s P Series simultaneously identifies elements (Al13 through U92 on the periodic table) in each of up to 5 coating layers, with exceptional precision and speed. It is ideal for test environments with high throughput schedules.

Standard system configurations include a 4-position collimator assembly, variable focus camera for applications with recessed areas, extended-life micro-focus X-ray tube and solid state PIN detector. The detector has well-defined element peaks, eliminating the need for secondary filters. Minimal peak position drift assures highest stability over time and extends the interval between recalibrations. An SDD detector is also available.

Unique to Bowman XRF instruments is the intimate proximity of the X-ray tube and detector, a feature of system architecture that produces more than three times the photon counts of conventional XRF equipment – and in a shorter measurement time.

The Bowman P Series has an extended programmable XY axis that makes it suitable for measuring small features, or parts such as fasteners, connectors, and PCBs. Table size is 25″ X 25″; travel is 10″ X 10″. It is ideally suited to shops that want to prevent their two costliest issues: rejections from under-plating, and material waste from over-plating.

The P Series is the 6th model in Bowman’s comprehensive suite of XRF instruments. Like other instruments in the portfolio, it runs advanced Xralizer software to quantify coating thickness from the detected photons. Xralizer software combines intuitive visual controls with time-saving shortcuts, extensive search capability, and “one-click” reporting. The software also simplifies user creation of new applications.

Bowman Appoints Lead XRF Scientist

February 19, 2018 Schaumburg, IL – Bowman, a US manufacturer of XRF coating measurement instruments, announces the appointment of Timothy He as Principal XRF Scientist.

In making the appointment, Bowman Chief Technology Officer Jun Choi, says, “Tim He will report directly to me, and will have two primary responsibilities. He will be responsible for the expansion of applications for Bowman XRF coating measurement technology, with a focus on EPIG, ENEPIG, and other PCB applications; he will also lead Bowman’s development team for materials integrity testing.”

Dr. He was previously Principal Scientist with Tribogenics, Inc., a manufacturer of triboluminescence-based X-ray products based in Los Angeles. Previous to that, he was Senior Detectors Scientist at Bruker Corporation.

“With his broad, but highly relevant background,” adds Choi, “Tim He is an extraordinary addition to our technical team.”

Applied Scientific Earns Praise at HKPCA

January, 2018. Congratulations to Arthur He, Bowman’s China Master Distributor, on a highly successful HKPCA* show and conference. All 5 Bowman Asia distributors work under Arthur’s excellent leadership, and attended Bowman’s regional distributors meeting during the event, which was held recently in Shenzhen.

He’s company is Applied Scientific Instruments Co., headquartered in Shanghai.

* Hong Kong Printed Circuits Association