主要特性與技術指標
B1506A 通用特性
高達 3 kV/1500 A 的運行范圍
-50 °C 至 +250 °C 的全自動快速熱測試
自動創建功率器件（半導體和元器件）技術資料
自動記錄功能可以避免數據丟失
B1506A IV 套件特性
快速的全自動封裝和晶圓上器件 IV 測量（Ron、BV、泄漏、Vth、Vsat 等）
窄 IV 脈寬（低至 10 μs），以防止器件自熱，并測量器件真實性能
示波器視圖（時域視圖）提供實際電壓/電流脈沖波形監測，以確保精確測量
可擴展配置，支持添加 CV 和 Qg 功能，以及擴展電流范圍由 20A 升至 500 A 或 1500 A
B1506A 完整套件特性
全部 IV 套件特性
高達 3 kV 的封裝器件晶體管輸入、輸出和反向轉移電容（Ciss、Coss、Crss、Cies、Coes、Cres）和柵極電阻（Rg）測量功能
封裝器件柵極電荷（Qg）曲線測量
功率損耗計算（傳導、驅動和切換損耗）
Main features and technical indicators
B1506A universal features
Operating range up to 3 kV/1500 A
- 50 ° C to + 250 ° C of full automatic quick thermal test
Automatically creates technical data for power devices (semiconductors and components)
Automatic recording can avoid data loss
B1506A IV suite features
Rapid and fully automated packaging and on-wafer device IV measurement (Ron, BV, leakage, Vth, Vsat, etc.)
Narrow IV pulse width (as low as 10 s) to prevent device self-heating and to measure device true performance
The oscilloscope view (time domain view) provides actual voltage/current pulse waveform monitoring to ensure accurate measurements
Expandable configuration, support to add CV and Qg function, and extend current range from 20A to 500a or 1500a
B1506A complete suite features
All IV suite features
Transistor input, output and reverse transfer capacitance (Ciss, Coss, Crss, Cies, Coes, Cres) and gate resistance (Rg) measurement functions up to 3 kV
Gate charge (Qg) curve measurement of packaged devices
Power loss calculation (conduction, drive and switching losses)
