杭州E5071C出租~臨安E5071C租賃-嘉興E5071C維修
主要特性和功能
9 kHz 至 4.5/6.5/8.5/14/20 GHz
2 或 4 端口，50 Ω，S 參數(shù)測(cè)試儀
具有 130 dB 寬動(dòng)態(tài)范圍、8 ms 快速測(cè)量速度和 0.005 dB/ °C 的出色溫度穩(wěn)定度，可改善測(cè)量精度、提高產(chǎn)品良率并增加設(shè)計(jì)裕量
增強(qiáng)時(shí)域分析選件可對(duì)高速串行互連進(jìn)行全面表征，增強(qiáng)您對(duì)設(shè)計(jì)
杭州E5071C出租~臨安E5071C租賃-嘉興E5071C維修
選件
了解詳細(xì)信息: 查看配置指南
Additional features
E5071C-010 時(shí)域分析選件
E5071C-790 測(cè)量向?qū)е郑∕WA）軟件
E5071C-008 頻率偏置模式
E5071C-TDR E5071C-TDR 增強(qiáng)型時(shí)域分析選件
Timebase stability
E5071C-UNQ Standard stability timebase
E5071C-1E5 High stability timebase
Calibration documentation
E5071C-1A7 Calibration + Uncertainties + Guardbanding (Not Accredited)
E5071C-A6J ANSI Z540-1-1994 Calibration
Test set
E5071C-280 2-port Test Set, 9 kHz to 8.5 GHz without Bias Tees
E5071C-285 2-port Test Set, 100 kHz to 8.5 GHz with Bias Tees
E5071C-480 4-port Test Set, 9 kHz to 8.5 GHz without Bias Tees
E5071C-485 4-port Test Set, 100 kHz to 8.5 GHz with Bias Tees
E5071C-240 2-port Test Set, 9 kHz to 4.5 GHz without Bias Tees
E5071C-245 2-port Test Set, 100 kHz to 4.5 GHz with Bias Tees
E5071C-440 4-port Test Set, 9 kHz to 4.5 GHz without Bias Tees
E5071C-2K5 2-port Test Set, 300 kHz to 20 GHz with Bias Tees
E5071C-445 4-port Test Set, 100 kHz to 4.5 GHz with Bias Tees
E5071C-4K5 4-port Test Set, 300 kHz to 20 GHz with Bias Tees
E5071C-4D5 4-port Test Set, 300 kHz to 14 GHz with Bias Tees
E5071C-465 4-port Test Set, 100 kHz to 6.5 GHz with Bias Tees
E5071C-460 4-port Test Set, 9 kHz to 6.5 GHz without Bias Tees
E5071C-2D5 2-port Test Set, 300 kHz to 14 GHz with Bias Tees
E5071C-265 2-port Test Set, 100 kHz to 6.5 GHz with Bias Tees
E5071C-260 2-port Test Set, 9 kHz to 6.5 GHz without Bias Tees
杭州E5071C出租~臨安E5071C租賃-嘉興E5071C維修
技術(shù)指標(biāo)
了解詳細(xì)信息: 查看技術(shù)資料
| zui大頻率 | 20 GHz |
|---|---|
| 動(dòng)態(tài)范圍 | 123 dB |
| 輸出功率 | 10 dBm |
| 軌跡噪聲 | 0.003 dBrms |
| 內(nèi)置端口數(shù)量 | 2 或 4 端口 |
| 諧波 | -25 dBc |
| 本底噪聲 | -131 dBm |
| 掃描速度zui高可達(dá) 201 個(gè)點(diǎn) | 5 ms |
| 應(yīng)用 |
|
| 元器件 |
|
| 臺(tái)式 | 是 |
選件和升級(jí)
- 選件
- Additional features
- Timebase stability
- Calibration documentation
- Test set
- Hard disk drive options
- Accessories
- 保修、校準(zhǔn)和服務(wù)
- 售后升級(jí)
選件
了解詳細(xì)信息: 查看配置指南
| Additional features | |||
| E5071C-010 | 時(shí)域分析選件 | ||
| E5071C-790 | 測(cè)量向?qū)е郑∕WA）軟件 | ||
| E5071C-008 | 頻率偏置模式 | ||
| E5071C-TDR | E5071C-TDR 增強(qiáng)型時(shí)域分析選件 | ||
| Timebase stability | |||
| E5071C-UNQ | Standard stability timebase | ||
| E5071C-1E5 | High stability timebase | ||
| Calibration documentation | |||
| E5071C-1A7 | Calibration + Uncertainties + Guardbanding (Not Accredited) | ||
| E5071C-A6J | ANSI Z540-1-1994 Calibration | ||
| Test set | |||
| E5071C-280 | 2-port Test Set, 9 kHz to 8.5 GHz without Bias Tees | ||
| E5071C-285 | 2-port Test Set, 100 kHz to 8.5 GHz with Bias Tees | ||
| E5071C-480 | 4-port Test Set, 9 kHz to 8.5 GHz without Bias Tees | ||
| E5071C-485 | 4-port Test Set, 100 kHz to 8.5 GHz with Bias Tees | ||
| E5071C-240 | 2-port Test Set, 9 kHz to 4.5 GHz without Bias Tees | ||
| E5071C-245 | 2-port Test Set, 100 kHz to 4.5 GHz with Bias Tees | ||
| E5071C-440 | 4-port Test Set, 9 kHz to 4.5 GHz without Bias Tees | ||
| E5071C-2K5 | 2-port Test Set, 300 kHz to 20 GHz with Bias Tees | ||
| E5071C-445 | 4-port Test Set, 100 kHz to 4.5 GHz with Bias Tees | ||
| E5071C-4K5 | 4-port Test Set, 300 kHz to 20 GHz with Bias Tees | ||
| E5071C-4D5 | 4-port Test Set, 300 kHz to 14 GHz with Bias Tees | ||
| E5071C-465 | 4-port Test Set, 100 kHz to 6.5 GHz with Bias Tees | ||
| E5071C-460 | 4-port Test Set, 9 kHz to 6.5 GHz without Bias Tees | ||
| E5071C-2D5 | 2-port Test Set, 300 kHz to 14 GHz with Bias Tees | ||
| E5071C-265 | 2-port Test Set, 100 kHz to 6.5 GHz with Bias Tees | ||
| E5071C-260 | 2-port Test Set, 9 kHz to 6.5 GHz without Bias Tees | ||
| Hard disk drive options | |||
| E5071C-017 | Removable Data Storage | ||
| E5071C-019 | Standard Data Storage | ||
| Accessories | |||
| E5071C-1CM | Rack mount kit | ||
| E5071C-1CN | Front handle kit | ||
| E5071C-1CP | Rack mount and front handle kit | ||
| E5071C-810 | Add keyboard | ||
| E5071C-820 | Add mouse | ||
資源中心
查看全部資料: 訪問文檔庫
關(guān)鍵產(chǎn)品信息
查看此產(chǎn)品的詳細(xì)功能。
技術(shù)指標(biāo)
- ENA 2/4端口射頻網(wǎng)絡(luò)分析儀技術(shù)資料
- N4690矢量網(wǎng)絡(luò)分析儀電子校準(zhǔn)模塊
- USB2.0 Cable-Connector Assembly Compliance Test - Test Solution Overview Using the ENA Option TDR
- 更多
手冊(cè)
- ENA 系列：服務(wù)與支持主頁（手冊(cè)，固化軟件）
- E5071C Security Features
- E5071C ENA Network Analyzers Service Guide
- 更多
手冊(cè)和競(jìng)爭(zhēng)力概覽
- Keysight E5071C ENA 網(wǎng)絡(luò)分析儀
- Premium HDMI Cable Test Solution - Flyer
- 從電氣到協(xié)議的 PCI Express® 設(shè)計(jì)與測(cè)試――手冊(cè)
- 更多
選擇與配置指南
- ENA射頻網(wǎng)絡(luò)分析儀配置指南
- 是德科技網(wǎng)絡(luò)分析儀選型指南
- 阻抗測(cè)量附件
- 更多
樣機(jī)
- 優(yōu)酷-網(wǎng)絡(luò)分析儀
- 優(yōu)酷-網(wǎng)絡(luò)分析儀
- E5071C ENA Series Network Analyzer Quick Demo Guide
- 更多
支持文檔
探討此產(chǎn)品如何應(yīng)對(duì)特定的測(cè)量挑戰(zhàn)。
- 應(yīng)用說明
- 解決方案概述
| Network Analyzer Application Note List and Application Matrix This provides the list of application notes related with solution and application. |
| Simple Scalar Network Analysis of Frequency Converter Devices - Application Note This application note shows the way to make easy scalar network analysis or power measurement using the Keysight U2000 series USB power sensor with the ENA network analyzers. |
| ENA 網(wǎng)絡(luò)分析儀的多端口綜合測(cè)量解決方案應(yīng)用指南 現(xiàn)在的許多器件都將多種功能集成到單一器件中，從而導(dǎo)致每個(gè)器件都具有多個(gè)射頻端口。在無線通信領(lǐng)域，很多器件，如蜂窩手機(jī)等都需要支持多頻帶功能和更多制式的信號(hào)... |
| 將您的8753更換為ENA網(wǎng)絡(luò)分析儀的七個(gè)理由 ENA的測(cè)試性能比8753ES有相當(dāng)大的提高，表現(xiàn)在動(dòng)態(tài)范圍、軌跡噪聲等方面，從而使您的測(cè)試質(zhì)量大大提高。圖1和圖2顯示出了ENA和8753ES的動(dòng)態(tài)范圍和軌跡噪聲的明顯對(duì)比。。。 |
| Keysight Technologies 如何確保USB Type-C™傳輸線纜與連接器的互操作性和標(biāo)準(zhǔn)*性 Keysight Technologies 如何確保USB Type-C™傳輸線纜與連接器的互操作性和標(biāo)準(zhǔn)*性 |
| 是德科技利用Keysight ENA 系列網(wǎng)絡(luò)分析儀進(jìn)行無線充電（WPT）測(cè)量 是德科技利用Keysight ENA 系列網(wǎng)絡(luò)分析儀進(jìn)行無線充電（WPT）測(cè)量 |
| Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
| Impedance Analyzers and Network Analyzers - Application Note This application note describes the benefits of using USB and LAN interfaces compared to GPIB. The target instruments are bench-top network analyzers, impedance analyzers and LCR meters. |
| Method of Implementation (MOI) for USB Type-C to Legacy Adapter Assembly Compliance Test Keysight Method of Implementation (MOI) for USB Type-C to Legacy Adapter Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
| Method of Implementation (MOI) for USB Type-C to Legacy Cable-Connector Assembly Compliance Test Keysight Method of Implementation (MOI) for USB Type-C to Legacy Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
| Method of Implementation (MOI) for USB Type-C to Type-C Cable-Connector Assembly Compliance Test Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
| E5080A ENA 系列網(wǎng)絡(luò)分析儀 E5080A ENA 系列網(wǎng)絡(luò)分析儀 |
| Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines. |
| Keysight ENA 系列網(wǎng)絡(luò)分析儀E5071C 選件TDR 增強(qiáng)型時(shí)域分析 Keysight ENA 系列網(wǎng)絡(luò)分析儀E5071C 選件TDR 增強(qiáng)型時(shí)域分析 |
| Achieving Higher Measurement Accuracy & Better Correlation for PCB Impedance Test - Application Note Traditional method for PCB impedance measurements is difficult to meet accuracy required today. Measurement with full calibration is introduced to meet accuracy for the latest PCB impedance test. |
| Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test Using Keysight E5071C ENA Network Analyzer Option TDR |
| Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver. |
| Impedance and Network Analysis Application List Application Note This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers. |
| 《使用網(wǎng)絡(luò)分析儀進(jìn)行時(shí)域分析》應(yīng)用指南（AN 1287-12） 本文重點(diǎn)介紹如何使用矢量網(wǎng)絡(luò)分析儀（VNA）執(zhí)行時(shí)域分析（顯示）。其目的是幫助工程師了解頻域背景，深入分析如何根據(jù)頻域數(shù)據(jù)（S 參數(shù)）生成時(shí)域顯示，以及如何應(yīng)用時(shí)域顯示解決射頻系統(tǒng)中的常見問題。 |
| Keysight Method of Implementation (MOI) for 100BASE-TX Ethernet Cable Tests Keysight Method of Implementation (MOI) for 100BASE-TX Cable Tests Using Keysight E5071C ENA Option TDR |
| 是德差分器件高級(jí)測(cè)量和建模 本文回答了“我是否需要真實(shí)差分信號(hào)，測(cè)量我的非線性放大器”的問題。在測(cè)量許多有源差分電路的非線性特點(diǎn)時(shí)，測(cè)量單端非線性響應(yīng)、然后再計(jì)算差分響應(yīng)已經(jīng)足夠了。本文考察了為什么使用單端技術(shù)仍能正確測(cè)量非線性差分電路，討論了測(cè)試差分電路時(shí)的拓?fù)淇紤]因素。。。 |
| Keysight Method of Implementation (MOI) for DisplayPort 1.3 Cable-Connector Assembly Compliance Test Keysight Method of Implementation (MOI) for DisplayPort 1.3 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
| Keysight Method of Implementation (MOI) for DisplayPort1.2b Cable-Connector Assembly Compliance Test Keysight Method of Implementation (MOI) for DisplayPort 1.2b Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
| 是德科技 材料測(cè)量: PCB 材料 是德科技 材料測(cè)量: PCB 材料 |
| Keysight Method of Implementation (MOI) for USB3.1 Cable-Connector Assembly Compliance Test Keysight Method of Implementation (MOI) for USB3.1 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
| Non-Contact Measurement Method for 13.56 MHz RFID Tags – Application Note For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer. |
| Method of Implementation(MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Keysight Method of Implementation (MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR |
| Method of Implementation (MOI) for HEAC Cable Assembly Test Method of Implementation (MOI) for HEAC Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR. |
| Keysight Method of Implementation (MOI) for SATA RXTX Impedance Compliance Test Keysight Method of Implementation (MOI) for SATA RXTX Impedance Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
| Keysight Method of Implementation (MOI) for SATA SI Compliance Test Keysight Method of Implementation (MOI) for SATA SI Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
| Keysight Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Keysight Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
| Keysight Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Keysight Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
| Keysight Method of Implementation (MOI) for MHL Cables Compliance Tests Keysight Method of Implementation (MOI) for MHL Cable Compliance Tests Using Keysight E5071C ENA Network Analyzer Option TDR |
| Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR. |
| Keysight Method of Implementation (MOI) for 10GBASE-T Ethernet Cable Tests Keysight Method of Implementation (MOI) for 10GBASE-T Cable Tests Using Keysight E5071C ENA Option TDR |
| Method of Implementation(MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Keysight Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR |
| Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Keysight E5071C ENA Option TDR |
| Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Keysight E5071C ENA Option TDR |
| Materials Measurement: Phantoms - Application Brief This application brief provides the solutions for measuring Phantom materials that are used in wireless and medical industries. |
| Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test Using ENA Option TDR |
| MEMS/NEMS Device Measurement Solution Keysight helps you characterize MEMS/NEMS device. |
| ENA系列RF網(wǎng)絡(luò)分析儀夾具方針功能介紹 在對(duì)現(xiàn)代RF電路進(jìn)行評(píng)估時(shí)，RF工程師通常需要對(duì)測(cè)量到的S參數(shù)進(jìn)行處理。下面簡(jiǎn)要解釋這四類應(yīng)用。*是隨著表面安裝器件(SMD)越來越廣泛地采用，它已取代了傳統(tǒng)的同軸接口器件，因此RF元器件的測(cè)量普遍 使用了測(cè)試夾具。。。 |
| 是德測(cè)試奇才助手 是德測(cè)試奇才助手， 適用于ENA/E5091A的軟件。MWA軟件提高多端口器件測(cè)試的生產(chǎn)效率 - 應(yīng)用指南1463-8 |
| E5071C ENA 射頻網(wǎng)絡(luò)分析儀利用外部開關(guān)提供多端口解決方案應(yīng)用指南 E5071C ENA射頻網(wǎng)絡(luò)分析儀. 圖1顯示了一個(gè)多端網(wǎng)絡(luò)分析解決方案的示例，另外還顯示了 Keysight E5091A 測(cè)試儀的內(nèi)部結(jié)構(gòu)圖。 |
| 使用20GHz E5071C ENA 網(wǎng)絡(luò)分析儀進(jìn)行UWB天線測(cè)量應(yīng)用指南 借助20GHz ENA的出色的性能和測(cè)量速度， 可將測(cè)試成本降至zui低。超寬帶(UWB)是一項(xiàng)快速發(fā)展的技術(shù)，它用于傳輸大帶寬(>500MHz)范圍內(nèi)的信息，以便進(jìn)行短距離、寬帶寬通信。通過使用近期由管理機(jī)構(gòu)批準(zhǔn)的極低的發(fā)射電平... |
| 使用網(wǎng)絡(luò)和阻抗分析儀評(píng)測(cè)13.56 MHz RFID 標(biāo)簽和閱讀器/記錄器 本應(yīng)用指南面向從事 RFID 天線設(shè)計(jì)和測(cè)試的工程師，探討了如何使用網(wǎng)絡(luò)分析儀和阻抗分析儀測(cè)試 RFID 天線特征，例如阻抗和諧振頻率。 |
| 使用 ENA 頻率偏置模式進(jìn)行精確的混頻器測(cè)量（AN 1463-6） Recommended measurement procedures for evaluating mixers. |
| In-Fixture Characterization Using the ENA Series RF Network Analyzer with Cascade Microtech... This product note explains a new approach for in-fixture characterization, using the Keysight ENA Series RF network analyzer with Cascade Microtech's probing system. |
| E5071C的*功能對(duì)射頻放大器進(jìn)行測(cè)試 E5071C的*功能對(duì)射頻放大器進(jìn)行測(cè)試 |
| Impedance Measurements - Evaluating EMC Components with DC Bias Superimposed This application note gives an overview on how to evaluate electromagnetic compatible (EMC) components in a way that satisfies strict EMC requirements. It also introduces various EMC measurement solutions. |
| Improve the Circuit Evaluation Efficiency of Wireless LAN Chip Set Design (AN 1463-2) This application note introduces circuit and component characteristics for the WLAN chipset design process using the ENA Series network analyzers. The topics highlighted are balanced measurements, fixture characterizations, and impedance matching. |
| On-wafer Balanced Component Measurement using the ENA RF Network Analyzer with the Cascade Microtech This product note discusses how to perform full 4-port error correction using the ENA Series with Cascade Microtech's dual-tip Air Coplanar Probe (ACP). |
| How to configure HP Basic to communicate with the Keysight ENA analyzer via SCPI-LAN |
| Impedance Characteristic Evaluation of SMD by Using the ENA with Inter-Continental Microwave (ICM) This application note describes impedance characteristic evaluation of SMD by using the ENA RF network analyzer with the ICM test fixture. |
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論壇：發(fā)帖
| 2017-04-19 12:20 | How to save s11 parameter values from VNA to pc |
|---|---|
| 2017-04-19 08:27 | what are the raw (no system correction) directivity and source match of the E5080 VNA? |
| 2017-04-19 08:27 | looking for 85019B (8753B/C Time domain option) install manual |
| 2017-04-13 02:00 | NF calibration: Power sensor vs Noise Source |
| 2017-04-14 16:05 | How to calculate averaging count according to VBW/RBW ratio? |
| 2017-04-14 05:02 | How to determine switch terms on E5071B? |
| 2017-04-13 00:40 | Balun measurements |
| 2017-04-11 08:43 | Obsolete N5230A option 083 Available? |
| 2017-04-11 04:56 | Can an E5071C with latest XP firmware A.11.24 read a Touchstone file? |
| 2017-04-10 16:15 | Does anyone have a schematic for a IFR2398 spectrum analyser?Thanks. Chris |
訪問論壇
常見問題
| 2015-11-24 | E5071C-TDR 高速數(shù)字應(yīng)用實(shí)施方法（MOI） |
|---|---|
| 2015-07-27 | 微軟終止支持 Windows XP，對(duì)我的 ENA 有何影響？ |
| 2015-03-09 | 如何使用 ENA 執(zhí)行 75 Ω 測(cè)量？ |
| 2014-08-11 | When automating markers on the ENA is it possible to programmatically query the indicated inductance or capacitance on a Smith Chart? |
| 2014-04-28 | 什么是 CPU / 存儲(chǔ)器 / Windows 操作系統(tǒng)的歷史記錄？ |
| 2014-04-27 | ENA 網(wǎng)絡(luò)分析儀系列升級(jí) |
| 2014-03-27 | ENA 時(shí)域測(cè)量的精度是多少？ |
| 2012-12-28 | 能否使用 USB 存儲(chǔ)器來更新 ENA的固化軟件? |
| 2012-12-28 | 是否提供 ENA 7 系列的逐步測(cè)量示例？ |
| 2012-12-20 | Is it possible to programmatically receive the displayed low/high stimulus values when using the "CALC1:MARK:BWID:DATA?" bandwidth query results? |
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